kw.\*:("Monocrystalline silicon wafer")
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Multi-asperity nanotribological behavior of single-crystal silicon: Crystallography-induced anisotropy in friction and wearSTEMPFLE, Philippe; TAKADOUM, Jamal.Tribology international. 2012, Vol 48, pp 35-43, issn 0301-679X, 9 p.Conference Paper
